Fault-tolerance and reliability techniques for high-density random-access memories
Publication details: New Delhi Pearson Education 2002Description: xix,426pISBN:- 81-7808-769-3
Item type | Current library | Call number | Status | Date due | Barcode |
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University Library | 004.332.3 CHA (Browse shelf(Opens below)) | Missing Reported | 00050054 |
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004:330.341 CHA/S Superconnected | 004.332 ALT Memory design | 004.332 ALT;1 Memory design: Microcomputers to mainframes | 004.332.3 CHA Fault-tolerance and reliability techniques for high-density random-access memories | 004.332.34 ABU Nanometer variation-tolerant SRAM | 004.332.34 SIN Robust SRAM designs and analysis | 004.3/.35 IBM GOV'2 IBM PC and clones: hardware trouble shooting and maintenance |
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