Nanometer technology designs:high quality delay tests

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Publication details: New York Springer 2008Edition: Description: xvii,281pISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	University Library	620.3 TEH (Browse shelf(Opens below))	Available		00060997

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Previous	620.3 SUN/A.21 Advanced characterization of nanostructured materials : probing the structure and dynamics with synchrotron x-rays and neutrons	620.3 SYL Nanotechnology	620.3 TAN Nanoscale phenomena	620.3 TEH Nanometer technology designs:high quality delay tests	620.3 TEH Emerging nanotechnologies: test, defect tolerance and reliability	620.3 TIM Nanotechnology	620.3 TSE Nanofabrication: fundamentals and applications	Next

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