Nanometer variation-tolerant SRAM circuits and statistical design for yield Mohamed H. Abu-Rahma and Mohab Anis

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Publication details: London Springer 2013Description: xvi, 170pISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	University Library	004.332.34 ABU (Browse shelf(Opens below))	Available		00076215

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Previous	004.332 ALT Memory design	004.332 ALT;1 Memory design: Microcomputers to mainframes	004.332.3 CHA Fault-tolerance and reliability techniques for high-density random-access memories	004.332.34 ABU Nanometer variation-tolerant SRAM	004.332.34 SIN Robust SRAM designs and analysis	004.3/.35 IBM GOV'2 IBM PC and clones: hardware trouble shooting and maintenance	004.3/.4 ABR Computer hardware and software	Next

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