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VLSI test principles and architectures: design for testability

By:

Wang, laung-Terng [ed.] [ed. by ]

Contributor(s):

Series: (Morgan Kaufmann series in systems on silicon)Publication details: Amsterdam Elsevier 2006 Description: xxx, 777pISBN:

0-12-370597-5

Subject(s):

Integrated circuits-very large scale integration-testing Integrated circuits-very large scale integration-design

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Item type	Current library	Call number	Status	Date due	Barcode
Books	University Library	621.3.049.77 WAN (Browse shelf(Opens below))	Available		00056985

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