TY  - GEN
AU  - Koster, Gertjan
AU  - Rijnders, Guus; ed.by
TI  - In situ characterization of thin film growth
T2  - Woodhead publishing in materials
SN  - 9781845699345
PY  - 2011///
CY  - Cambridge
PB  - Woodhead Publishing
KW  - Thin film growth - Electron diffraction techniques
KW  - Crystal growth
ER  -