TY  - GEN
AU  - Haight, Richard; ed.
AU  - Ross, Frances M
AU  - Hannon, James B
TI  - Handbook of instrumentation and techniques for semiconductor nanostructure characterization 
T2  - World scientific series in materials and energy
SN  - 9789814322805
PY  - 2012///
CY  - Singapore
PB  - World Scientific publishing
KW  - Semiconductors
KW  - Nanostructures - Electronmicroscopy
KW  - x-ray diffraction
KW  - Scanning microscopy
ER  -