TY  - GEN
AU  - Birkholz, Mario 
TI  - Thin film analysis by xray scattering
SN  - 9783527607594
PY  - 2006///
PB  - Wiley
KW  - Materials Characterization
UR  - http://onlinelibrary.wiley.com/book/10.1002/3527607595
ER  -