TY  - GEN
AU  - Servin, Manuel
AU  -  Quiroga, Antonio J
AU  - Padilla, Moises J 
TI  - Fringe pattern analysis for optical metrology: theory, algorithms and applications
SN  - 9783527411528
PY  - 2014///
CY  - Germany
PB  - Wiley-VCH
KW  - Interferometry
KW  - Metrology
KW  - Optical measurements
KW  - Diffraction patterns
ER  -