TY  - GEN
AU  - Leng,Yang. 
TI  - Materials characterization:  Introduction to microscopic and spectroscopic method
SN  - 9783527670772
PY  - 2013///
PB  - Wiley
KW  - Materials
KW  - Material analysis
N1  - The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content.

The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational
UR  - http://onlinelibrary.wiley.com/book/10.1002/9783527670772
ER  -