TY  - BOOK
AU  - Wang, laung-Terng [ed.]
AU  - Cheng-Wu [ed.]
AU  - Xiaoqing Wen [ed.]
TI  - VLSI test principles and architectures: design for testability 
T2  - (Morgan Kaufmann series in systems on silicon)
SN  - 0-12-370597-5
PY  - 2006///
CY  - Amsterdam
PB  - Elsevier
KW  - Integrated circuits-very large scale integration-testing
KW  - Integrated circuits-very large scale integration-design
ER  -