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VLSIDesign for manufacturing yield enhancement by
  • Director, Stephen W
  • Wojciech Maly
  • Strojwas, Andrzej J
Series: (Kluwer International series in engineering and computer science. VLSI, computer architecture and digital signal processing)
Publication details: Boston Kluwer Academic 1990
Availability: Items available for loan: University Library (1)Call number: 621.3.049.77 DIR.
VLSI technology by
  • Sze, S.M
Edition: 2nd ed
Publication details: New Delhi Tata McGraw Hill 2003
Availability: Items available for loan: University Library (1)Call number: 621.3.049.77 SZE"2003".
VLSI test principles and architectures: design for testability by
  • Wang, laung-Terng [ed.] [ed. by ]
  • Cheng-Wu [ed.]
  • Xiaoqing Wen [ed.]
Series: (Morgan Kaufmann series in systems on silicon)
Publication details: Amsterdam Elsevier 2006
Availability: Items available for loan: University Library (1)Call number: 621.3.049.77 WAN.
System-on-chip test architectures: nanometer design for testability by
  • Wang, Laung-Terng [ed. by]
  • Stround, Charles E. Touba, Nur A
Edition:
Publication details: Boston Morgan Kaufmann 2008
Availability: Items available for loan: University Library (1)Call number: 621.9 WAN.
Basic VLSI design Douglas A Pucknell and Kamran Eshraghian by
  • Pucknell,Douglas A
  • Eshraghian,Kamran
Edition: 3rd ed.
Publication details: New Delhi Prentice Hall of India 2008
Availability: Items available for loan: University Library (2)Call number: 621.3.049.77 PUC, ...
VLSI design K.Lal Koshore and V.S.V. Prabhakar by
  • Kishore, Lal K
  • Prabhakar, V.S.V
Publication details: New Delhi I.K.International Publishing 2011
Availability: Items available for loan: University Library (1)Call number: 621.3.049.77 KIS.
Top-down digital VLSI design from architectures to gate-level circuits and FPGAs by
  • Kaeslin, Hubert
Publication details: Amsterdam Elsevier 2015
Availability: Items available for loan: University Library (1)Call number: 621.3.049.77 KAE.
Pages
University Library, CUSAT