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Nanometer technology designs:high quality delay tests by
  • Tehranipoor, Mohammad []
  • Ahmed,Nisar
Edition:
Publication details: New York Springer 2008
Availability: Items available for loan: University Library (1)Call number: 620.3 TEH.
Emerging nanotechnologies: test, defect tolerance and reliability by
  • Tehranipoor, Mohammad [ed. by]
Edition:
Publication details: New York Springer 2008
Availability: Items available for loan: University Library (1)Call number: 620.3 TEH.
Pages
University Library, CUSAT