| 000 | 01087nam a2200253 a 4500 | ||
|---|---|---|---|
| 001 | adlib96000001 | ||
| 003 | ViArRB | ||
| 005 | 200902210153555.7 | ||
| 008 | 960221s1955 dcuabcdjdbkoqu001 0deng d | ||
| 020 | _a | ||
| 022 | _a | ||
| 040 | _aAdlib | ||
| 082 | _a537.333.35 | ||
| 245 | _aMicroscopy of materials; Modern Imageing methods usign electron x-ray and ion beams | ||
| 250 | _a | ||
| 260 |
_aLondon _bMacmillan _c1975 |
||
| 300 |
_aix, 304 p. _c |
||
| 500 | _a | ||
| 100 |
_aBowen, D K _e |
||
| 700 |
_a _a |
||
| 942 | _cBK | ||
| 653 |
_aElectricity _aElectronics _aAmplifiers- electronics _aCybernetics _adigital electronics _aElectric conductors _aElectronic circuits _aSemiconductors _aSuperconductors _aTransistors _aMicroelectronics _aSemiconductor _aEngineering _aTechnology _aPhysics _aOptics _aBiophysics _aAstrophysics _aNuclear physics _aRadioactivity _aQuantum theory _aMechanics _aHydrostatics _aThermodynamics _aScience _aChemistry _aElectronics and electricity |
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| 952 |
_w2010-06-16 _p00009511 _r2010-06-16 _40 _00 _bUL _10 _o537.333.35 BOW _d2010-06-16 _70 _yBK _aUL |
||
| 999 |
_c14113 _d14112 |
||