000			00582nam a22001577a 4500
005			20090827122141.0
008			090827t xxu||||| |||| 00| 0 eng d
080			_a621.3.049.77 _bWANG
100			_aWang, Francis C. _93524
245			_aDigital circuit testing: _ba guide to DFT and other techniques
300			_axi, 233p.
942			_cBK
260			_aSan Diego _bAcademic Press _c1991 _93525
500			_aRef. at the end of each chap.
952			_w2009-08-27 _p00039980 _r2013-02-26 _40 _00 _bUL _10 _o621.3.049.77 WANG _d2009-08-27 _70 _2udc _yBK _s2013-02-01 _l1 _aUL
999			_c3161 _d3161