000 00539nam a2200181 a 4500
005 20131003151703.0
008 960221s1955 dcuabcdjdbkoqu001 0deng d
020 _a81-7808-769-3
100 _aChakraborty, Kanad
245 _aFault-tolerance and reliability techniques for high-density random-access memories
260 _aNew Delhi
_bPearson Education
_c2002
300 _axix,426p.
500 _a
653 _aRAM- fault tolerance
_aComputer memory
_aComputer science
700 _aMazumder, Pinaki
942 _cBK
003 ViArRB
999 _c46305
_d46304