| 000 | 00824nam a2200253 a 4500 | ||
|---|---|---|---|
| 001 | adlib96000001 | ||
| 003 | ViArRB | ||
| 005 | 200902210153555.7 | ||
| 008 | 960221s1955 dcuabcdjdbkoqu001 0deng d | ||
| 020 | _a0471476692 | ||
| 022 | _a | ||
| 040 | _aAdlib | ||
| 082 | _a621.38.004.65 | ||
| 245 | _aCMOS electronics: How it works, how it fails | ||
| 250 | _a | ||
| 260 |
_aUSA _bWiley-Interscience _c2004 |
||
| 300 |
_axviii, 348p. _c |
||
| 500 | _a | ||
| 100 |
_aSegura, Jaume _e |
||
| 700 |
_aHawkins, Charles F. _a |
||
| 942 | _cBK | ||
| 653 |
_aElectronic failure analysis _aIntegrated circuits- failure analysis _aComplementary metal oxide semiconductor (CMOS) _aCMOS |
||
| 952 |
_w2010-06-16 _p00052073 _r2012-12-05 _40 _00 _bUL _m1 _10 _o621.38.004.65 SEG _d2010-06-16 _70 _yBK _s2012-10-18 _l4 _aUL |
||
| 999 |
_c48259 _d48258 |
||