| 000 | 00739nam a2200253 a 4500 | ||
|---|---|---|---|
| 001 | adlib96000001 | ||
| 003 | ViArRB | ||
| 005 | 200902210153555.7 | ||
| 008 | 960221s1955 dcuabcdjdbkoqu001 0deng d | ||
| 020 | _a | ||
| 022 | _a | ||
| 040 | _aAdlib | ||
| 082 | _a621.317.32 | ||
| 245 | _aIEEE standard techniques for high voltage testing | ||
| 250 | _a | ||
| 260 |
_a _bInstitute of Electrical and Electronics Engineers _c1978 |
||
| 300 |
_a125p. _c |
||
| 500 | _a | ||
| 100 |
_aIEEE standard _e |
||
| 700 |
_a _a |
||
| 942 | _cBK | ||
| 653 |
_aMeasurement systems _ahigh voltage testing _aelectric measurements |
||
| 952 |
_w2010-11-24 _p00016773 _r2010-11-24 _40 _00 _bUL _10 _o621.317.32 POW _d2010-11-24 _70 _yBK _aUL |
||
| 999 |
_c69139 _d69138 |
||