000 00814nam a22002057a 4500
005 20110318123021.0
008 110318t xxu||||| |||| 00| 0 eng d
080 _a548:537.533.35
_bWEI
100 _aWeirich, Thomas E.,ed
_eed.by
_915046
245 _aElectron crystallography
_bnovel approaches for structure determination of nanosized materials
_ced.by Thomas E Weirich, Jonos L Labar, Xiaodong Zou
300 _a536p.
490 _aNATO science series
653 _aElectron microscopy
_aElectron diffraction
700 _aLabar, Jonos L .,ed.
_915048
700 _aZou, Xiaodong .,ed.
_915049
942 _cBK
260 _aNetherlands
_bSpringer
_c2004
_915047
020 _a9781402039195
952 _p00060903
_40
_00
_bUL
_10
_o548:537.533.35 WEI
_d2011-03-18
_70
_cGEN
_2udc
_yBK
_aUL
999 _c72170
_d72169