| 000 | 00734 a2200205 4500 | ||
|---|---|---|---|
| 005 | 20121130104324.0 | ||
| 008 | 121130t xxu||||| |||| 00| 0 eng d | ||
| 080 |
_a539.216 _bKOS |
||
| 100 |
_aKoster, Gertjan _eEd. by _922270 |
||
| 245 |
_aIn situ characterization of thin film growth _cGertjan Koster and Guus Rijnders |
||
| 300 | _axi, 282p. | ||
| 490 | _aWoodhead publishing in materials | ||
| 653 | _aThin film growth - Electron diffraction techniques | ||
| 653 | _aCrystal growth | ||
| 700 |
_aRijnders, Guus; ed.by _922269 |
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| 942 | _cBK | ||
| 260 |
_bWoodhead Publishing _c2011 _aCambridge _922271 |
||
| 020 | _a9781845699345 | ||
| 952 |
_70 _p00067817 _40 _00 _2udc _bUL _yBK _10 _o539.216 KOS _d2012-11-30 _aUL |
||
| 999 |
_c74886 _d74885 |
||