| 000 | 01148 a2200253 4500 | ||
|---|---|---|---|
| 005 | 20130225095314.0 | ||
| 008 | 130225t xxu||||| |||| 00| 0 eng d | ||
| 080 |
_a621.382:681.7 _bHAI.1-.2 R |
||
| 100 |
_aHaight, Richard; ed. _eed. by _922991 |
||
| 245 |
_aHandbook of instrumentation and techniques for semiconductor nanostructure characterization _ced. by Richard Haight, Frances M. Ross and James B. Hannon |
||
| 300 | _a2v. 610p. | ||
| 490 | _aWorld scientific series in materials and energy | ||
| 653 | _aSemiconductors | ||
| 653 | _aNanostructures - Electronmicroscopy | ||
| 653 | _ax-ray diffraction | ||
| 653 | _aScanning microscopy | ||
| 700 |
_aRoss, Frances M _922992 |
||
| 700 |
_aHannon, James B _922993 |
||
| 942 | _cREF | ||
| 260 |
_bWorld Scientific publishing _c2012 _aSingapore _922102 |
||
| 020 | _a9789814322805 | ||
| 952 |
_w2012-02-24 _p00067570 _v0.00 _r2012-02-24 _40 _e89 _00 _bUL _10 _o621.382:681.7 HAI.1 R _d2012-02-24 _71 _cREF _2udc _g0.00 _yREF _aUL |
||
| 952 |
_w2013-02-25 _p00067571 _r2013-02-25 _40 _00 _bUL _10 _o621.382:681.7 HAI.2 R _d2013-02-25 _71 _cREF _2udc _yREF _aUL |
||
| 999 |
_c74919 _d74918 |
||