000 00495 a2200181 4500
005 20130829114920.0
008 130518b xxu||||| |||| 00| 0 eng d
020 _a9780470597200
080 _a004.412
_bABR
100 _aAbran, Alain
245 _aSoftware metrics and software metrology
260 _bJohn Wiley & Sons
_c2010
_aNew Jersey
300 _axix, 328p.
490 _aIEEE computer society
653 _aSoftware measurement methods
653 _aSoftware metrics
942 _cBK
999 _c76025
_d76024