000 00416 a2200145 4500
005 20131021103202.0
008 131021b xxu||||| |||| 00| 0 eng d
020 _a9783527607594
100 _aBirkholz, Mario
245 _aThin film analysis by xray scattering
260 _c2006
_bWiley
653 _aMaterials Characterization
856 _uhttp://onlinelibrary.wiley.com/book/10.1002/3527607595
942 _cEB
999 _c77989
_d77988