| 000 | 00670 a2200217 4500 | ||
|---|---|---|---|
| 005 | 20150121120320.0 | ||
| 008 | 150121b xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9783527411528 | ||
| 080 |
_a535.241 _bSER |
||
| 100 | _aServin, Manuel | ||
| 245 |
_aFringe pattern analysis for optical metrology _btheory, algorithms and applications _cManuel Servin, J Antonio Quiroga and J Moises Padilla |
||
| 260 |
_c2014 _bWiley-VCH _aGermany |
||
| 300 | _axvi, 327p. | ||
| 653 | _aInterferometry | ||
| 653 | _aMetrology | ||
| 653 | _aOptical measurements | ||
| 653 | _aDiffraction patterns | ||
| 700 | _a Quiroga, Antonio J | ||
| 700 | _aPadilla, Moises J | ||
| 942 | _cBK | ||
| 999 |
_c80621 _d80620 |
||