000			00230 a2200085 4500
999			_c86777 _d86776
005			20180420150457.0
008			180112b ||||| |||| 00| 0 eng d
020			_a9783527670772
100			_aLeng,Yang.
245			_aMaterials characterization _b Introduction to microscopic and spectroscopic method
250			_a2nd
260			_bWiley _c2013
500			_aThe new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content. The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational
653			_aMaterials
653			_aMaterial analysis
856			_uhttp://onlinelibrary.wiley.com/book/10.1002/9783527670772
942			_cEB