Fabrication and characterization of doped and undoped ZnO thin films by ALD method and their applciation in UV detectors

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Publication details: Kochi Department of Instrumentation, CUSAT 2022Description: xxii, 196pSubject(s):

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Item type	Current library	Call number	Status	Date due	Barcode
Theses	University Library	681.2:539.216 LID/F T (Browse shelf(Opens below))	Not for loan		T0001927

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Previous	681.2(083.7) CAM CAMAC instrumentation and interface standards	681.2.088 VIN Characterization of human and instrument related measurement errors	681.2-5 HUG Measurment and control basis	681.2:539.216 LID/F T Fabrication and characterization of doped and undoped ZnO thin films by ALD method and their applciation in UV detectors	681.2:62 PAD Treatise on instrumentation engineering	681.2:620.3 LEA Fundamental principles of engineering nanometrology	681.2:620.3 MEL/S T Synthesis, characterization and application of MoS2 based nanostructures	Next

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