Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale

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Publication details: New York Springer 2007Edition: Description: xx, 980pISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	University Library	621.385.833 KAL.1 (Browse shelf(Opens below))	Available		00057588
Books	University Library	621.385.833 KAL.2 (Browse shelf(Opens below))	Available		00057589

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Previous	621.385.83 ELE Proceedings of symposium on electron beam technology and applications (SEBTA 2000):Mumbai: 22-24 November, 2000	621.385.832 CAM Advanced Oscilloscope Hand Book, for Technicians and Engineers	621.385.833 HEI Fundamentals of Transmission electron Microscopy	621.385.833 KAL.1 Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale	621.385.833 KAL.2 Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale	621.38-595 LAC Handbook of electronic safety procedures	621.38:60 SHI Organic electronics in sensors and biotechnology	Next

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