Emerging nanotechnologies: test, defect tolerance and reliability

By:

Contributor(s):

Publication details: New York Springer 2008Edition: Description: xii, 405pISBN:

ISSN:

Subject(s):

DDC classification:

Tags from this library: No tags from this library for this title. Log in to add tags.

Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	University Library	620.3 TEH (Browse shelf(Opens below))	Available		00060998

Previous								Next
Previous	620.3 SYL Nanotechnology	620.3 TAN Nanoscale phenomena	620.3 TEH Nanometer technology designs:high quality delay tests	620.3 TEH Emerging nanotechnologies: test, defect tolerance and reliability	620.3 TIM Nanotechnology	620.3 TSE Nanofabrication: fundamentals and applications	620.3 TSU Computational methods for nanoscale applications	Next

There are no comments on this title.

to post a comment.