Fringe pattern analysis for optical metrology theory, algorithms and applications Manuel Servin, J Antonio Quiroga and J Moises Padilla

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Publication details: 2014 Wiley-VCH GermanyDescription: xvi, 327pISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	University Library	535.241 SER (Browse shelf(Opens below))	Available		00072086

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