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Preparation and characterization of high-k aluminium oxide thin films by atomic layer deposition for gate dielectric applications Anu Philip; guided by K. Rajeev Kumar

By: Contributor(s): Publication details: Kochi Department of Instrumentations; Cusat 2011 Description: 202pSubject(s):
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Item type Current library Call number Status Date due Barcode
Theses Theses University Library Reference 537.226:539.23 ANU T (Browse shelf(Opens below)) Not for loan T0000555

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