Fringe pattern analysis for optical metrology theory, algorithms and applications Manuel Servin, J Antonio Quiroga and J Moises Padilla

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Publication details: 2014 Wiley-VCH GermanyDescription: xvi, 327pISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	University Library	535.241 SER (Browse shelf(Opens below))	Available		00072086

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Previous	535.232.1 HOW Principles of random signals analysis and low noise design: the power spectral density and its application	535.241 MCC Optical measurements for Scientists and Engineers	535.241 REI/I T Investigations on laser speckle techniques for certain engineering and biological applications	535.241 SER Fringe pattern analysis for optical metrology	535.241 SIR Introduction to optical metrology	535.241 WIL Introduction to the optical transfer function	535.241 YOS Handbook of optical metrology	Next

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